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Defect and Fault Tolerance in VLSI and Nanotechnology Systems IEEE Transactions on Emerging Topics in Computing |
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CALL FOR PAPERS
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The continuous scaling of CMOS devices as well as the increased interest in the use of emerging technologies make more and more important the topics related to defect and fault tolerance in VLSI and nanotechnology systems. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation, are of interest. The IEEE Transaction on Emerging Topics in Computing (TETC) seeks original manuscripts for a Special Section on Defect and Fault Tolerance in VLSI Systems scheduled to appear in the December issue of 2016. The topics of interest for this special issue include, but are not limited to:
Submitted articles must describe original research which is not published nor currently under review by other journals or conferences. Extended conference papers should contain at least 40% new material and will pass through the normal review process. As an author, you are responsible for understanding and adhering to our submission guidelines. You can access them at the IEEE Computer Society web site, www.computer.org. Please thoroughly read these before submitting your manuscript. TETC is the newest Transactions of the IEEE Computer Society with hybrid open access publishing model. |
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Submitted articles must describe original research which is not published nor currently under review by other journals or conferences. Extended conference papers should contain at least 40% new material and will pass through the normal review process. As an author, you are responsible for understanding and adhering to our submission guidelines. You can access them at the IEEE Computer Society web site, www.computer.org. Please thoroughly read these before submitting your manuscript. TETC is the newest Transactions of the IEEE Computer Society with hybrid open access publishing model. Please submit your paper to Manuscript Central at https://mc.manuscriptcentral.com/tetc-cs |
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Please address all other correspondence regarding this special Section to the Guest Editors. Omer Khan (University of Connecticut) – khan@uconn.edu |
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